AT319103T

Method for testing an integrated circuit having confidential software or hardware elements

Abstract

This record has no abstract on file.

Term

Term ended

Expired 26 January 2020, 6.7 years ago.

  1. Priority and filed
  2. Granted
  3. Expired
  4. Today

13 members in 7 offices

This recordMember, by publication date

Members13

Family members, oldest first
DocumentOfficeKind
US2001010080A1United States of AmericaA1
EP1120662A1European Patent Office (EPO)A1
KR20010078041ARepublic of KoreaA
JP2001264396AJapanA
US6944778B2United States of AmericaB2
SG114485A1SingaporeA1
EP1120662B1European Patent Office (EPO)B1
AT319103TThis recordAustriaT
ATE319103T1AustriaT1
DE60026186D1GermanyD1
DE60026186T2GermanyT2
KR100818620B1Republic of KoreaB1
JP4886934B2JapanB2