Nova Patents
AT309547T

Fritting inspection method and apparatus

Abstract

The present invention is an insulating film of the inspection electrode (P) by electrical contact with the probe (12A) for checking in the test method for performing electrical characteristics tests on the device, by using a fritting phenomenon to the electrode (P) for the test ( O) destroying, scan probe (12A) and the step of electrically contacting the contact electrode (P) and the inspection is disclosed.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

24 members in 7 offices

This recordMember, by publication datePriority claim

Priority claims2

Priority claims
DocumentOfficeKindDate
2000249702JapanA
2001093303JapanA

Members24

Family members, oldest first
DocumentOfficeKind
US2002021142A1United States of AmericaA1
EP1182460A2European Patent Office (EPO)A2
KR20020015294ARepublic of KoreaA
JP2002139542AJapanA
TW497194BTaiwan Province of ChinaB
EP1182460A3European Patent Office (EPO)A3
US6777967B2United States of AmericaB2
US2004174177A1United States of AmericaA1
EP1182460B1European Patent Office (EPO)B1
AT309547TThis recordAustriaT
ATE309547T1AustriaT1
DE60114730D1GermanyD1
US7061259B2United States of AmericaB2
KR20060066165ARepublic of KoreaA
DE60114730T2GermanyT2
US2006192578A1United States of AmericaA1
US2007229101A1United States of AmericaA1
US7304489B2United States of AmericaB2
US7319339B2United States of AmericaB2
KR20080077952ARepublic of KoreaA
KR20100018603ARepublic of KoreaA
KR20110004346ARepublic of KoreaA
JP4841737B2JapanB2
KR101132904B1Republic of KoreaB1