Wireless radio frequency testing method of integrated circuits and wafers

Apparatus for testing an integrated wafer circuit comprising: a) a test circuit formed on the wafer with the integrated circuit comprising the test circuit: i) an oscillator circuit variable ring having an oscillator circuit based ring and a plurality of sub-circuits coupled to the base ring oscillator circuit; and, ii) a control circuit for coupling selectively subcircuits oscillator circuit based ring to change the frequency of oscillation of said variable ring oscillator circuit based on a selected sub-circuit; and, b) a unit independent testing of the wafer, the test unit connected wireless to the test circuit to transmit a signal to activate the test circuit, in which the test circuit, when activated by the unit being test, test runs an independent integrated at least one of the aforementioned subcircuits selected by the control circuit, being the result of that test represented by the change in the frequency of said variable ring oscillator circuit to circuit.