Scanning unit for an optical position measuring device

In a scanning unit for an optical position measuring device comprising a structured optoelectronic photodetector, which comprises a plurality of adjacently arranged on a common semiconductor substrate radiation sensitive detector regions D and I1-I6, which are connected via conductor paths L1-L8 with an evaluation device, which conductor tracks are L1-L8 passed over the surface of the detector areas D and I1-I6, and with associated detector regions or sub-areas detector D; I1-I6, provide the in-phase scanning signals, respectively. This allows the detector regions D or I1-I6 occupy a maximum area and extends up to the side edges 61, 62 of the photodetector (Fig. 4).