Stabilized alkaline compositions for cleaning microelectronic substrates
Abstract
The invention provides an aqueous alkaline compounds, by dropping it in the micro industry photo-negative photoresist residue and other pollutants to stripping or cleaning semiconductor chip substrate. These combination property General contains (a) a or multiple not with metal ion of alkali, its dosage enough to produced about for 10-13 of pH value, and a or multiple dip bath stability agent, it at least has a pKa value for 10-13, to in using process in the keep this pH value; (b) depending on needs joined about 0.01 (weight)%-about 5 (weight)% (with SiO2% said) of not with metal ion of water-soluble Portland; (c) depending on needs joined about 0.01 (weight)%-about 10 (weight)% One or more of chelating agent; (d) as necessary to include approximately 0.01 (weight) of about 80%-(weight) of one or more% of water soluble organic solvent; and (e) as necessary to include approximately 0.01 (weight) of about 1%-(weight)% water-soluble surfactants.
Term
No projected expiry on record.
- Priority
- Filed
- Granted
- Today
49 members in 18 offices
Priority claims3
| Document | Office | Kind | Date |
|---|---|---|---|
| 68855900 | United States of America | A | |
| 85914201 | United States of America | A | |
| 0142406 | United States of America | W |
Members49
| Document | Office | Kind | |
|---|---|---|---|
| CA2330747A1 | Canada | A1 | |
| WO9960448A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU4189599A | Australia | A | |
| WO9960448A8 | World Intellectual Property Organization (WIPO) | A8 | |
| KR20010034866A | Republic of Korea | A | |
| EP1105778A1 | European Patent Office (EPO) | A1 | |
| CN1309785A | China | A | |
| IL139546D0 | Israel | D0 | |
| CA2425613A1 | Canada | A1 | |
| WO0233033A1 | World Intellectual Property Organization (WIPO) | A1 | |
| AU9694701A | Australia | A | |
| HK1039806A1 | Hong Kong, China | A1 | |
| US2002077259A1 | United States of America | A1 | |
| US6465403B1 | United States of America | B1 | |
| KR20030051721A | Republic of Korea | A | |
| US6585825B1 | United States of America | B1 | |
| EP1326951A1 | European Patent Office (EPO) | A1 | |
| US6599370B2 | United States of America | B2 | |
| JP2003526111A | Japan | A | |
| IL155429D0 | Israel | D0 | |
| CN1469918A | China | A | |
| JP2004511917A | Japan | A | |
| HK1062310A1 | Hong Kong, China | A1 | |
| MXPA03003353A | Mexico | A | |
| TWI226520B | Taiwan Province of China | B | |
| EP1326951B1 | European Patent Office (EPO) | B1 | |
| AT288468TThis record | Austria | T | |
| ATE288468T1 | Austria | T1 | |
| DE60108774D1 | Germany | D1 | |
| CN1205325C | China | C | |
| MXPA00011391A | Mexico | A | |
| IL139546A | Israel | A | |
| MY121446A | Malaysia | A | |
| DE60108774T2 | Germany | T2 | |
| MY124511A | Malaysia | A | |
| KR100610387B1 | Republic of Korea | B1 | |
| CN100370360C | China | C | |
| TWI294909B | Taiwan Province of China | B | |
| HK1039806B | Hong Kong, China | B | |
| EP1105778B1 | European Patent Office (EPO) | B1 | |
| AT436043T | Austria | T | |
| ATE436043T1 | Austria | T1 | |
| DE69941088D1 | Germany | D1 | |
| PT1105778E | Portugal | E | |
| DK1105778T3 | Denmark | T3 | |
| ES2328309T3 | Spain | T3 | |
| CA2330747C | Canada | C | |
| JP4565741B2 | Japan | B2 | |
| JP4758055B2 | Japan | B2 |
1 legal event, as the office reported them to INPADOC
Events
| Event | Code | |
|---|---|---|
| Ceased as to paragraph 5 lit. 3 law introducing patent treatiesCeasedRER | RER |
Numbers
- Application
- 1977863
Titles2
- German
- STABILE ALKALISCHE ZUSAMMENSETZUNGEN ZUM REINIGEN VON MIKROELEKTRONISCHEN SUBSTRATEN
- English
- STABLE ALKALINE COMPOSITIONS FOR CLEANING MICROELECTRONIC SUBSTRATES
Classification
- CPC, 17
- H01L21/02063
- C11D3/00
- C11D3/0073
- C11D7/261
- C11D7/265
- C11D7/3209
- C11D7/3245
- C11D11/0047
- C23F1/32
- C23G1/22
- G03F7/425
- H01L21/02071
- C23G1/20
- H01L21/02052
- H01L21/31133
- Y10S134/902
- Y10S438/906
- IPC, 14
- C11D7 14
- C11D3 00
- C11D7 26
- C11D7 32
- C11D7 34
- C11D7 36
- C11D7 50
- C11D11 00
- C23F1 32
- C23G1 22
- G03F7 42
- H01L21 304
- H01L21 306
- H01L21 311