AT224964T

Method of depositing thin group iiia metal films

Abstract

A wherein the high-purity the) acrylate group OF metal layer deposition the method is substrate, comprising a substrate and tertiary butyl compound with of) acrylate group OF metal, and then of the compound, is arranged on the deposition of the substrate the )acrylate A metal element. Method of the invention can be used in any suitable substrate, to silicon and polyimide. Method of the invention can be used for ) acrylate group OF metal and/or the growth of silicon alloy, and reacting for the semiconductor according to claim alloy, each to AlGaAs, AlInAs and depositing a bond of alloy.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

18 members in 11 offices

This recordMember, by publication datePriority claim1 more office is in the list below

Priority claims2

Priority claims
DocumentOfficeKindDate
9315771United KingdomA
9401654United KingdomW

Members18

Family members, oldest first
DocumentOfficeKind
GB9315771D0United KingdomD0
CA2168214A1CanadaA1
WO9504168A1World Intellectual Property Organization (WIPO)A1
AU7267494AAustraliaA
KR960704085ARepublic of KoreaA
CN1130924AChinaA
JPH09501985AJapanA
EP0804631A1European Patent Office (EPO)A1
AU686207B2AustraliaB2
DE804631T1GermanyT1
US5863836AUnited States of AmericaA
CN1072735CChinaC
EP0804631B1European Patent Office (EPO)B1
AT224964TThis recordAustriaT
ATE224964T1AustriaT1
DE69431443D1GermanyD1
KR100352726B1Republic of KoreaB1
DE69431443T2GermanyT2