Nova Patents
AT174124T

Novel method of making, testing and test device for integrated circuits.

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
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  4. Today

139 members in 10 offices

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Priority claims
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19459688United States of AmericaA

Members139

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US4195375AUnited States of AmericaA
WO8911659A1World Intellectual Property Organization (WIPO)A1
US4924589AUnited States of AmericaA
US4994735AUnited States of AmericaA
BR8907190ABrazilA
US5020219AUnited States of AmericaA
US5034685AUnited States of AmericaA
WO9112706A1World Intellectual Property Organization (WIPO)A1
JPH03504657AJapanA
US5103557AUnited States of AmericaA
EP0561765A4European Patent Office (EPO)A4
EP0515577A1European Patent Office (EPO)A1
US5225771AUnited States of AmericaA
EP0515577A4European Patent Office (EPO)A4
WO9316394A1World Intellectual Property Organization (WIPO)A1
EP0557079A2European Patent Office (EPO)A2
EP0561765A1European Patent Office (EPO)A1
JPH05507177AJapanA
WO9321748A1World Intellectual Property Organization (WIPO)A1
JPH0669345AJapanA
WO9409513A1World Intellectual Property Organization (WIPO)A1
US5323035AUnited States of AmericaA
US5354695AUnited States of AmericaA
KR950701136ARepublic of KoreaA
EP0641485A1European Patent Office (EPO)A1
EP0557079A3European Patent Office (EPO)A3
BR9404327ABrazilA
EP0664925A1European Patent Office (EPO)A1
US5451489AUnited States of AmericaA
JPH07508614AJapanA
US5453404AUnited States of AmericaA
EP0664925A4European Patent Office (EPO)A4
JPH08502146AJapanA
US5512397AUnited States of AmericaA
US5571741AUnited States of AmericaA
US5580687AUnited States of AmericaA
WO9641204A1World Intellectual Property Organization (WIPO)A1
US5592007AUnited States of AmericaA
US5592018AUnited States of AmericaA
TW297145BTaiwan Province of ChinaB
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US5633209AUnited States of AmericaA
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EP0641485A4European Patent Office (EPO)A4
US5725995AUnited States of AmericaA
EP0832438A1European Patent Office (EPO)A1
US5749698AUnited States of AmericaA
JPH10150083AJapanA
EP0845680A1European Patent Office (EPO)A1
BR9306232ABrazilA
EP0515577B1European Patent Office (EPO)B1
AT167977TAustriaT
ATE167977T1AustriaT1
DE69129692D1GermanyD1
CN1191019AChinaA
EP0832438A4European Patent Office (EPO)A4
EP0864870A2European Patent Office (EPO)A2
US5834334AUnited States of AmericaA
US5840593AUnited States of AmericaA
EP0561765B1European Patent Office (EPO)B1
AT174124TThis recordAustriaT
ATE174124T1AustriaT1
EP0557079B1European Patent Office (EPO)B1
DE68928870D1GermanyD1
DE69322667D1GermanyD1
US5869354AUnited States of AmericaA
KR19990022254ARepublic of KoreaA
US5946559AUnited States of AmericaA
JPH11512231AJapanA
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JP2000200812AJapanA
EP0864870A3European Patent Office (EPO)A3
US6288561B1United States of AmericaB1
US6294909B1United States of AmericaB1
KR100307082B1Republic of KoreaB1
EP0664925B1European Patent Office (EPO)B1
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DE69331416D1GermanyD1
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US2002045297A1United States of AmericaA1
JP3308016B2JapanB2
EP1233444A2European Patent Office (EPO)A2
JP3323846B2JapanB2
EP1233444A3European Patent Office (EPO)A3
US2003057513A1United States of AmericaA1
DE69331416T2GermanyT2
KR100374893B1Republic of KoreaB1
CN1116613CChinaC
US2003151421A1United States of AmericaA1
KR100397214B1Republic of KoreaB1
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KR20030097600ARepublic of KoreaA
KR20040002953ARepublic of KoreaA
US6682981B2United States of AmericaB2
US6713327B2United States of AmericaB2
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