Nova Patents
AT101718T

Method of flaw detection in billets.

Abstract

This record has no abstract on file.

Term

No projected expiry on record.

  1. Priority
  2. Filed
  3. Granted
  4. Today

18 members in 10 offices

This recordMember, by publication datePriority claim

Priority claims1

Priority claims
DocumentOfficeKindDate
890106NorwayA

Members18

Family members, oldest first
DocumentOfficeKind
NO890106D0NorwayD0
CA2006300A1CanadaA1
NO890106LNorwayL
EP0378006A1European Patent Office (EPO)A1
KR900012095ARepublic of KoreaA
JPH02298846AJapanA
NO166424BNorwayB
DD291628A5German Democratic Republic (until 1990)A5
NO166424CNorwayC
US5069005AUnited States of AmericaA
KR920003536B1Republic of KoreaB1
RU1838779CRussian FederationC
EP0378006B1European Patent Office (EPO)B1
AT101718TThis recordAustriaT
DE68913183D1GermanyD1
CA2006300CCanadaC
DE68913183T2GermanyT2
JP2528530B2JapanB2